Innovative technologies, directly issued from fundamental science developments
Measuring defects inside the matter
POSITHÔT has a technology allowing to quantify the absence of matter inside the matter.
In particular :
- The space between atoms and molecular chains;
- The proportion of missing atoms in the crystalline and amorphous structures.
With existing solutions
The existing analysis techniques
The existing analysis systems on the market allow to measure the composition of materials.
The POSITHÔT systems offer solutions for defect analysis inside materials complementary to solutions currently on the market.
PERFORMANCE AND RELIABILITY
From these positrons generators, POSITHÔT develops a range of R&D and surface control instruments. POSITHÔT generators deliver between 50 and 200 times more positrons than the radioactive sources. A version producing 1000 times more positrons is under construction. This flow is comparable to the one obtained using a nuclear research reactors. The POSITHÔT systems have performances outside the current standards :
They allow to detect the absence of one single atom among a million atoms.
the POSITHÔT technology allows measuring empty volumes from the size of one atom to cracks of about ten microns (this corresponds to the lack of about ten billion atoms)
The POSITHÔT technology allows the measure of the defects in all types of materials independently of their structure or chemical nature
The POSITHÔT technology does not damage the materials which are analyzed.
EXAMPLESOF MATERIALS SCIENCE APPLICATIONS
CLICK ON AN ICON TO DISCOVER THE TECHNOLOGICAL APPLICATIONS
Positrons can characterize the density of defects in thermal barrier coatings, as well as in bulk materials.
The free volume between molecular chains can be measured using positron spectroscopy. The knowledge of this value is critical for filtration, permeation and depollution processes.
Positrons can determine the damaging level of stressed parts well before cracks appear.
Dopants studies in innovative monocristals for the semiconductor industry can be achieved with positrons.
The quality level of monocrystal wafers can be determined using positrons for electronic applications.
The quality of the interfaces under thin films can be measured, as well as their evolution over time. All photonics devices can benefit from such knowledge.
Open and closed porosities can be measured, as a function of depth, for all low-density materials like adsorbents and catalysts.
Areas with lack of matter within amorphous structures can be quantified, and their volume measured..